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Four-quadrant silicon and silicon carbide photodiodes for beam position monitor applications: electrical characterization and electron irradiation effects
Rafí, J.M., Pellegrini, G., Godignon, P., Quirion, D., Hidalgo, S., Matilla, O., Fontserè, A., Molas, B., Takakura, K., Tsunoda, I., Yoneoka, M., Pothin, D., Fajardo, P.Volume:
13
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/13/01/C01045
Date:
January, 2018
File:
PDF, 9.23 MB
english, 2018