[IEEE 2017 IEEE Nuclear & Space Radiation Effects...

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[IEEE 2017 IEEE Nuclear & Space Radiation Effects Conference (NSREC): Radiation Effects Data Workshop (REDW) - New Orleans, LA (2017.7.17-2017.7.21)] 2017 IEEE Radiation Effects Data Workshop (REDW) - Single Event Effect Assessment of a 1-Mbit Commercial Magneto-resistive Random Access Memory (MRAM)

Adell, Philippe C., Moro, Slaven, Gouyet, Lionel, Chatry, Christian, Vermeire, Bert
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Year:
2017
Language:
english
DOI:
10.1109/nsrec.2017.8115456
File:
PDF, 577 KB
english, 2017
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