[IEEE 2017 IEEE Nuclear & Space Radiation Effects Conference (NSREC): Radiation Effects Data Workshop (REDW) - New Orleans, LA (2017.7.17-2017.7.21)] 2017 IEEE Radiation Effects Data Workshop (REDW) - ELDRS Characterization up to 100 krad of Texas Instruments' Dual Amplifier LM158
Myers, Brianna, Kruckmeyer, Kirby, Trinh, ThangYear:
2017
Language:
english
DOI:
10.1109/nsrec.2017.8115458
File:
PDF, 192 KB
english, 2017