[IEEE 2017 IEEE Nuclear & Space Radiation Effects Conference (NSREC): Radiation Effects Data Workshop (REDW) - New Orleans, LA (2017.7.17-2017.7.21)] 2017 IEEE Radiation Effects Data Workshop (REDW) - Space and Terrestrial Radiation Response of Silicon Carbide Power MOSFETs
Akturk, Akin, McGarrity, James M., Wilkins, Richard, Markowski, Adam, Cusack, BrendanYear:
2017
Language:
english
DOI:
10.1109/nsrec.2017.8115467
File:
PDF, 550 KB
english, 2017