Critical radius phenomenon and mechanism for SF 6 gaps under very fast transient and lightning impulse voltages
Zhang, Lu, Wu, Jingfeng, Wang, Sen, Sun, Lei, Zhang, QiaogenVolume:
13
Language:
english
Journal:
IEEJ Transactions on Electrical and Electronic Engineering
DOI:
10.1002/tee.22577
Date:
March, 2018
File:
PDF, 760 KB
english, 2018