Amplitude modulation atomic force microscopy based on...

AIP Advances 2017 / 12 Vol. 7; Iss. 12

Amplitude modulation atomic force microscopy based on higher flexural modes

Zhou, Xilong, Zhuo, Rongshu, Wen, Pengfei, Li, Faxin
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Volume:
7
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.5004732
Date:
December, 2017
File:
PDF, 3.50 MB
english, 2017
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