Data-Driven Inter-Turn Short Circuit Fault Detection in...

IEEE Access 2017 Vol. 5

Data-Driven Inter-Turn Short Circuit Fault Detection in Induction Machines

Xu, Zhao, Hu, Changhua, Yang, Feng, Kuo, Shyh-Hao, Goh, Chi-Keong, Gupta, Amit, Nadarajan, Sivakumar
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Volume:
5
Year:
2017
Language:
english
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2017.2764474
File:
PDF, 3.00 MB
english, 2017
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