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[IEEE 2017 IEEE 2nd Advanced Information Technology, Electronic and Automation Control Conference (IAEAC) - Chongqing, China (2017.3.25-2017.3.26)] 2017 IEEE 2nd Advanced Information Technology, Electronic and Automation Control Conference (IAEAC) - Feature extraction and image recognition for the electrical symbols based on Zernike moment
Yin, Yongfei, Meng, Zhaoyong, Li, ShaoqianYear:
2017
Language:
english
DOI:
10.1109/IAEAC.2017.8054170
File:
PDF, 237 KB
english, 2017