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[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - 22FFL: A high performance and ultra low power FinFET technology for mobile and RF applications

Sell, B., Bigwood, B., Cha, S., Chen, Z., Dhage, P., Fan, P., Giraud-Carrier, M., Kar, A., Karl, E., Ku, C.-J., Kumar, R., Lajoie, T., Lee, H.-J., Liu, G., Liu, S., Ma, Y., Mudanai, S., Nguyen, L., Pa
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Year:
2017
DOI:
10.1109/IEDM.2017.8268475
File:
PDF, 621 KB
2017
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