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[IEEE 2017 IEEE 3rd International Conference on Electro-Technology for National Development (NIGERCON) - Owerri, Nigeria (2017.11.7-2017.11.10)] 2017 IEEE 3rd International Conference on Electro-Technology for National Development (NIGERCON) - A performance analysis of logistic regression and support vector machine classifiers for spoof fingerprint detection
Ibrahim, Yusuf, Mu'Azu, Muhammed. B., Adedokun, Adewale. E., Sha'Aban, Yusuf. A.Year:
2017
Language:
english
DOI:
10.1109/NIGERCON.2017.8281872
File:
PDF, 479 KB
english, 2017