Morphology and FT IR spectra of porous silicon

Journal of Electrical Engineering 2017 / 12 Vol. 68; Iss. 7

Morphology and FT IR spectra of porous silicon

Kopani, Martin, Mikula, Milan, Kosnac, Daniel, Gregus, Jan, Pincik, Emil
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Volume:
68
Language:
english
Journal:
Journal of Electrical Engineering
DOI:
10.1515/jee-2017-0056
Date:
December, 2017
File:
PDF, 1.03 MB
english, 2017
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