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Operational stability of solution-processed indium-oxide thin-film transistors: Environmental condition and electrical stress
Baang, Sungkeun, Lee, Hyeonju, Zhang, Xue, Park, Jaehoon, Kim, Won-Pyo, Ko, Young-Woong, Piao, Shang Hao, Choi, Hyoung Jin, Kwon, Jin-Hyuk, Bae, Jin-HyukVolume:
72
Language:
english
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.72.151
Date:
January, 2018
File:
PDF, 1.22 MB
english, 2018