Bayes Inference for General Repairable Systems

Bayes Inference for General Repairable Systems

Pan, Rong, Rigdon, Steven E.
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Volume:
41
Language:
english
Journal:
Journal of Quality Technology
DOI:
10.1080/00224065.2009.11917762
Date:
January, 2009
File:
PDF, 616 KB
english, 2009
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