![](/img/cover-not-exists.png)
Influence of internal stress and layer thickness on the formation of hydrogen induced thin film blisters in Mo/Si multilayers
Bos, R A J M van den, Reinink, J., Lopaev, D.V., Lee, C J, Benschop, J P H, Bijkerk, FredLanguage:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/aaad86
Date:
February, 2018
File:
PDF, 1.04 MB
english, 2018