[IEEE 2017 12th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Siem Reap, Cambodia (2017.6.18-2017.6.20)] 2017 12th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Influences of circuit mismatch on paralleling silicon carbide MOSFETs
Haihong, Qin, Ying, Zhang, Ziyue, Zhu, Dan, Wang, Dafeng, Fu, Shishan, Wang, Chaohui, ZhaoYear:
2017
Language:
english
DOI:
10.1109/ICIEA.2017.8282906
File:
PDF, 536 KB
english, 2017