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[IEEE 2017 IEEE XXIV International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - Cusco, Peru (2017.8.15-2017.8.18)] 2017 IEEE XXIV International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - Predictive modeling for presumptive diagnosis of type 2 diabetes mellitus based on symptomatic analysis
Barrios, Ordonez, Alberto, Diego, Infantes, Vizcarra, Raphael, Erick, Aguirre, Armas, Alexander, JimmyYear:
2017
Language:
english
DOI:
10.1109/INTERCON.2017.8079667
File:
PDF, 162 KB
english, 2017