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[IEEE 2017 IEEE 3rd Information Technology and Mechatronics Engineering Conference (ITOEC) - Chongqing (2017.10.3-2017.10.5)] 2017 IEEE 3rd Information Technology and Mechatronics Engineering Conference (ITOEC) - A semi-supervised deep fuzzy C-mean clustering for two classes classification
Arshad, Ali, Riaz, Saman, Jiao, Licheng, Murthy, AparnaYear:
2017
Language:
english
DOI:
10.1109/ITOEC.2017.8122317
File:
PDF, 547 KB
english, 2017