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[IEEE 2017 IEEE 3rd International Conference on Electro-Technology for National Development (NIGERCON) - Owerri, Nigeria (2017.11.7-2017.11.10)] 2017 IEEE 3rd International Conference on Electro-Technology for National Development (NIGERCON) - A bimodal biometrie student attendance system
Charity, Atuegwu, Okokpujie, Kennedy, Etinosa, Noma-OsaghaeYear:
2017
Language:
english
DOI:
10.1109/NIGERCON.2017.8281916
File:
PDF, 2.31 MB
english, 2017