Projected Tolerances of Carbon Nanotube Current-Mode Logic...

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IEEE Transactions on Circuits and Systems II: Express Briefs 2017

Projected Tolerances of Carbon Nanotube Current-Mode Logic to Process Variability

Cheralathan, Muthupandian, Claus, Martin, Blawid, Stefan
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/TCSII.2017.2781139
File:
PDF, 504 KB
english, 2017
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