SEU Characterization of Three Successive Generations of...

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IEEE Transactions on Nuclear Science 2018

SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2 MeV Neutrons

Clemente, Juan Antonio, Hubert, Guillaume, Fraire, Juan, Franco, Francisco J., Villa, Francesca, Rey, Solenne, Baylac, Maud, Puchner, Helmut, Mecha, Hortensia, Velazco, Raoul
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2018.2800905
File:
PDF, 828 KB
english, 2018
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