Analysis and Control of RRAM Overshoot Current

IEEE Transactions on Electron Devices 2018 / 1 Vol. 65; Iss. 1

Analysis and Control of RRAM Overshoot Current

Shrestha, Pragya R., Nminibapiel, David M., Campbell, Jason P., Ryan, Jason T., Veksler, Dmitry, Baumgart, Helmut, Cheung, Kin P.
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2017.2776860
Date:
January, 2018
File:
PDF, 1.67 MB
english, 2018
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