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Evaluation of the Component of Bias of X-Ray Microanalysis Related to Surface Relief of the Specimen
Vasil’ev, A. L., Mityukhlyaev, V. B., Mikhutkin, A. A., Todua, P. A., Filippov, M. N.Volume:
53
Language:
english
Journal:
Inorganic Materials
DOI:
10.1134/S0020168517140163
Date:
December, 2017
File:
PDF, 270 KB
english, 2017