IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences
2010 Vol. E93-A; Iss. 7
![](/img/cover-not-exists.png)
A Study of Capture-Safe Test Generation Flow for At-Speed Testing
MIYASE, Kohei, WEN, Xiaoqing, KAJIHARA, Seiji, YAMATO, Yuta, TAKASHIMA, Atsushi, FURUKAWA, Hiroshi, NODA, Kenji, ITO, Hideaki, HATAYAMA, Kazumi, AIKYO, Takashi, SALUJA, Kewal K.Volume:
E93-A
Year:
2010
Language:
english
Journal:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
DOI:
10.1587/transfun.e93.a.1309
File:
PDF, 3.55 MB
english, 2010