Resistive switching mechanism of ZnO/ZrO 2 -stacked resistive random access memory device annealed at 300 °C by sol–gel method with forming-free operation
Jian, Wen-Yi, You, Hsin-Chiang, Wu, Cheng-YenVolume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.011501
Date:
January, 2018
File:
PDF, 1.55 MB
english, 2018