A fast method for process reliability analysis of...

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A fast method for process reliability analysis of CNFET-based digital integrated circuits

Saeedi, Fereshteh, Ghavami, Behnam, Raji, Mohsen
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Language:
english
Journal:
Journal of Computational Electronics
DOI:
10.1007/s10825-018-1134-8
Date:
February, 2018
File:
PDF, 707 KB
english, 2018
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