![](/img/cover-not-exists.png)
[IEEE 2017 IEEE International Joint Conference on Biometrics (IJCB) - Denver, CO, USA (2017.10.1-2017.10.4)] 2017 IEEE International Joint Conference on Biometrics (IJCB) - Evaluation of a 3D-aided pose invariant 2D face recognition system
Xu, Xiang, Le, Ha A., Dou, Pengfei, Wu, Yuhang, Kakadiaris, Ioannis A.Year:
2017
Language:
english
DOI:
10.1109/BTAS.2017.8272729
File:
PDF, 692 KB
english, 2017