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[IEEE 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Cincinnati, OH (2017.10.1-2017.10.5)] 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Reliability analysis and life testing of semiconductor devices for in-wheel motor drive system
Ji, Chao, Owen, Geoffrey, Brockway, Simon T. M., Hilton, ChrisYear:
2017
Language:
english
DOI:
10.1109/ECCE.2017.8095942
File:
PDF, 794 KB
english, 2017