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[IEEE 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Salinas (2017.10.16-2017.10.20)] 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - An aide diagnosis system based on k-means for insulin resistance assessment in eldery people from the Ecuadorian highlands
Vintimilla, Christian, Wong, Sara, Astudillo-Salinas, Fabian, Encalada, Lorena, Severeyn, ErikaYear:
2017
Language:
english
DOI:
10.1109/ETCM.2017.8247554
File:
PDF, 215 KB
english, 2017