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[IEEE 2017 IEEE International High-Level Design Validation and Test Workshop (HLDVT) - Santa Cruz, CA (2017.10.5-2017.10.6)] 2017 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Repair techniques for aged TSVs in 3D integrated circuits
Madani, Siroos, Khalil, Kasem, Dey, Bappaditya, Bonton, Devante, Bayoumi, MagdyYear:
2017
Language:
english
DOI:
10.1109/HLDVT.2017.8167463
File:
PDF, 914 KB
english, 2017