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[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - Temperature activation of the string current and its variability in 3-D NAND flash arrays
Resnati, D., Mannara, A., Nicosia, G., Paolucci, G. M., Tessariol, P., Lacaita, A. L., Spinelli, A. S., Compagnoni, C. MonzioYear:
2017
Language:
english
DOI:
10.1109/IEDM.2017.8268329
File:
PDF, 254 KB
english, 2017