![](/img/cover-not-exists.png)
[IEEE 2016 International Conference on Progress in Informatics and Computing (PIC) - Shanghai, China (2016.12.23-2016.12.25)] 2016 International Conference on Progress in Informatics and Computing (PIC) - A search-based approach for test suite generation from extended finite state machines
Rao, Sana, Jahan, Hosney, Liu, DongmeiYear:
2016
Language:
english
DOI:
10.1109/PIC.2016.7949471
File:
PDF, 154 KB
english, 2016