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[IEEE 2017 International Semiconductor Conference (CAS) - Sinaia (2017.10.11-2017.10.14)] 2017 International Semiconductor Conference (CAS) - Monitoring the stability of the fabricated high k Si MOS capacitors and investigation of the insulator/semiconductor interface
Pascu, Razvan, Varasteanu, Pericle, Kusko, Mihaela, Romanitan, Cosmin, Nastase, FlorinYear:
2017
Language:
english
DOI:
10.1109/SMICND.2017.8101184
File:
PDF, 623 KB
english, 2017