Circuit-Level Layout-Aware Modeling of Single Event Effects in 65 nm CMOS ICs
Balbekov, Anton O., Gorbunov, Maxim S., Zebrev, Gennady I.Year:
2018
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2018.2802205
File:
PDF, 596 KB
english, 2018