[IEEE 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Torino, Italy (2017.5.22-2017.5.25)] 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - AFM-based robust image analysis to contrast reversal effects in cell-cerium oxide nanoparticles interactions
Mencattini, A., Casti, P., Fazio, G., Martinelli, E., Di Natale, C., Ghibelli, L., Cricenti, A., Luce, M.Year:
2017
Language:
english
DOI:
10.1109/i2mtc.2017.7969970
File:
PDF, 609 KB
english, 2017