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Capacitance–Frequency Estimates of Border-Trap Densities in Multifin MOS Capacitors
Zhao, Simeng E., Jiang, Rong, Zhang, En Xia, Liao, Wenjun, Liang, Chundong, Fleetwood, Daniel M., Schrimpf, Ronald D., Reed, Robert A., Linten, Dimitri, Mitard, Jerome, Collaert, Nadine, Sioncke, SonjVolume:
65
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2017.2761298
Date:
January, 2018
File:
PDF, 2.35 MB
english, 2018