[IEEE 2017 IEEE International Joint Conference on Biometrics (IJCB) - Denver, CO, USA (2017.10.1-2017.10.4)] 2017 IEEE International Joint Conference on Biometrics (IJCB) - Unconstrained Face Detection and Open-Set Face Recognition Challenge
Gunther, M., Hu, P., Herrmann, C., Chan, C. H., Jiang, M., Yang, S., Dhamija, A. R., Ramanan, D., Beyerer, J., Kittler, J., Jazaery, M. Al, Nouyed, M. I., Guo, G., Stankiewicz, C., Boult, T. E.Year:
2017
Language:
english
DOI:
10.1109/BTAS.2017.8272759
File:
PDF, 398 KB
english, 2017