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[IEEE 2017 IEEE 35th International Conference on Computer Design (ICCD) - Boston, MA (2017.11.5-2017.11.8)] 2017 IEEE International Conference on Computer Design (ICCD) - Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights
Cheng, Eric, Abraham, Jacob, Bose, Pradip, Buyuktosunoglu, Alper, Campbell, Keith, Chen, Deming, Cher, Cheng-Yong, Cho, Hyungmin, Le, Binh, Lilja, Klas, Mirkhani, Shahrzad, Skadron, Kevin, Stan, MirceYear:
2017
DOI:
10.1109/ICCD.2017.103
File:
PDF, 176 KB
2017