[IEEE 2017 IEEE 35th International Conference on Computer...

  • Main
  • [IEEE 2017 IEEE 35th International...

[IEEE 2017 IEEE 35th International Conference on Computer Design (ICCD) - Boston, MA (2017.11.5-2017.11.8)] 2017 IEEE International Conference on Computer Design (ICCD) - Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights

Cheng, Eric, Abraham, Jacob, Bose, Pradip, Buyuktosunoglu, Alper, Campbell, Keith, Chen, Deming, Cher, Cheng-Yong, Cho, Hyungmin, Le, Binh, Lilja, Klas, Mirkhani, Shahrzad, Skadron, Kevin, Stan, Mirce
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
DOI:
10.1109/ICCD.2017.103
File:
PDF, 176 KB
2017
Conversion to is in progress
Conversion to is failed