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Predictions of Proton Cross-Section and Sensitive Thickness for Analog Single-Event Transients
Weulersse, Cecile, Morand, Sebastien, Miller, Florent, Carriere, Thierry, Mangeret, RenaudVolume:
63
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2016.2541692
Date:
August, 2016
File:
PDF, 2.90 MB
english, 2016