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Single event transients mitigation techniques for CMOS integrated VCOs
González Ramírez, David, Lalchand Khemchandani, Sunil, del Pino, Javier, Mayor-Duarte, Daniel, San Miguel-Montesdeoca, Mario, Mateos-Angulo, SergioVolume:
73
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2018.01.005
Date:
March, 2018
File:
PDF, 1.88 MB
english, 2018