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[IEEE 2017 Eighth International Conference on Intelligent Computing and Information Systems (ICICIS) - Cairo, Egypt (2017.12.5-2017.12.7)] 2017 Eighth International Conference on Intelligent Computing and Information Systems (ICICIS) - Patterned fabric defect detection system using near infrared imaging
Hamdi, Azhar A., Fouad, Mohamed M., Sayed, Mohammed S., Hadhoud, Mohiy M.Year:
2017
Language:
english
DOI:
10.1109/INTELCIS.2017.8260041
File:
PDF, 1.43 MB
english, 2017