[IEEE 2017 Eighth International Conference on Intelligent...

  • Main
  • [IEEE 2017 Eighth International...

[IEEE 2017 Eighth International Conference on Intelligent Computing and Information Systems (ICICIS) - Cairo, Egypt (2017.12.5-2017.12.7)] 2017 Eighth International Conference on Intelligent Computing and Information Systems (ICICIS) - Patterned fabric defect detection system using near infrared imaging

Hamdi, Azhar A., Fouad, Mohamed M., Sayed, Mohammed S., Hadhoud, Mohiy M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.1109/INTELCIS.2017.8260041
File:
PDF, 1.43 MB
english, 2017
Conversion to is in progress
Conversion to is failed