[IEEE 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 - Honololu, HI, USA (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - Extraction of a trapping model over an extended bias range for GaN and GaAs HEMTs
Tarazi, Jabra, Rathmell, James G., Parker, Anthony E., Mahon, Simon J.Year:
2017
Language:
english
DOI:
10.1109/MWSYM.2017.8059086
File:
PDF, 209 KB
english, 2017