High Resolution Optical Frequency Domain Reflectometry for...

IEEE Photonics Technology Letters 2017 / 8 Vol. 29; Iss. 16

High Resolution Optical Frequency Domain Reflectometry for Analyzing Intra-Chip Reflections

Zhao, Dan, Pustakhod, Dzmitry, Williams, Kevin, Leijtens, Xaveer
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
29
Language:
english
Journal:
IEEE Photonics Technology Letters
DOI:
10.1109/lpt.2017.2723242
Date:
August, 2017
File:
PDF, 1.24 MB
english, 2017
Conversion to is in progress
Conversion to is failed