Three-dimensional Integrated X-ray diffraction imaging of...

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Nano Letters 2018 / 02

Three-dimensional Integrated X-ray diffraction imaging of native strain in multi-layered WSe2

Cherukara, Mathew J., Schulman, Daniel S., Sasikumar, Kiran, Arnold, Andrew Joseph, Chan, Henry, Sadasivam, Sridhar, Maser, Joerg, Cha, Wonsuk, Das, Saptarshi, Sankaranarayanan, Subramanian K.R.S., Ha
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Language:
english
Journal:
Nano Letters
DOI:
10.1021/acs.nanolett.7b05441
Date:
February, 2018
File:
PDF, 1.33 MB
english, 2018
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