[IEEE 2017 Devices for Integrated Circuit (DevIC) - Kalyani, India (2017.3.23-2017.3.24)] 2017 Devices for Integrated Circuit (DevIC) - Effects on I-V characteristics of RTD due to different parametric variations
Banasree, Das, Manas, Parai, Saikat, MajumderYear:
2017
Language:
english
DOI:
10.1109/DEVIC.2017.8073947
File:
PDF, 425 KB
english, 2017