[IEEE 2017 IEEE East-West Design & Test Symposium...

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[IEEE 2017 IEEE East-West Design & Test Symposium (EWDTS) - Novi Sad (2017.9.29-2017.10.2)] 2017 IEEE East-West Design & Test Symposium (EWDTS) - Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications

Petrosyants, Konstantin O., Sambursky, Lev M., Kharitonov, Igor A., Ismail-zade, Mamed R.
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Year:
2017
Language:
english
DOI:
10.1109/EWDTS.2017.8110055
File:
PDF, 705 KB
english, 2017
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