Analysis and Modeling of Electroforming in Transition Metal...

IEEE Electron Device Letters 2018 / 1 Vol. 39; Iss. 1

Analysis and Modeling of Electroforming in Transition Metal Oxide-Based Memristors and Its Impact on Crossbar Array Density

Amer, Sherif, Hasan, Md Sakib, Rose, Garrett S.
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Volume:
39
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2017.2778639
Date:
January, 2018
File:
PDF, 701 KB
english, 2018
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