[IEEE 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - Pittsburgh, PA (2017.7.25-2017.7.28)] 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - Confocal imaging characterization of two-photon lithography microstructures for cell cultures
Lemma, Enrico Domenico, Spagnolo, Barbara, Sergio, Sara, Pisanello, Marco, Vittorio, Massimo De, Pisanello, Ferruccio, Lemma, Enrico Domenico, Pisanello, Marco, Vittorio, Massimo De, Sergio, SaraYear:
2017
Language:
english
DOI:
10.1109/NANO.2017.8233602
File:
PDF, 2.37 MB
english, 2017