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[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - First measurements of a prototype of a new generation pixel readout ASIC in 65 nm CMOS for extreme rate HEP detectors at HL-LHC
Panati, S., Paterno, A., Monteil, E., Pacher, L., Demaria, N., Rivetti, A., Rolo, M. Da Rocha, Wheadon, R., Rotondo, F., Dellacasa, G., Licciulli, F., Loddo, F., Ciciriello, F., Marzocca, C., MattiazzYear:
2016
Language:
english
DOI:
10.1109/NSSMIC.2016.8069857
File:
PDF, 2.05 MB
english, 2016