Experimental Analysis of Repeatability and Calibration...

IEEE Transactions on Microwave Theory and Techniques 2017 / 6 Vol. 65; Iss. 6

Experimental Analysis of Repeatability and Calibration Residuals in On-Wafer Non-Contact Probing

Caglayan, Cosan, Sertel, Kubilay
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2017.2649498
Date:
June, 2017
File:
PDF, 2.06 MB
english, 2017
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