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[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Uncertainty contribution in power measurements due to non-harmonic components
Parvis, M., Vallan, A.Year:
2000
Language:
english
DOI:
10.1109/imtc.2000.846808
File:
PDF, 346 KB
english, 2000